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Related Experiment Video

Updated: Oct 29, 2025

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Emissivity-compensated radiation thermometry method using a concave mirror.

D Terada1, T Iuchi2

  • 1Innovation Center, CHINO Corporation, 32-8 Kumano, Itabashi, Tokyo 173-8632, Japan.

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|July 10, 2021
PubMed
Summary
This summary is machine-generated.

This study introduces a novel method for simultaneously measuring temperature and emissivity in materials like metals and semiconductors. The technique utilizes a concave mirror and polarized radiometer, achieving accurate results with a temperature uncertainty of 6.0 K.

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Area of Science:

  • Materials Science
  • Optical Physics
  • Metrology

Background:

  • Accurate temperature and emissivity measurements are crucial for understanding material properties and behavior.
  • Existing methods often face limitations in simultaneous measurement or material applicability.
  • Surface properties significantly influence radiative characteristics.

Purpose of the Study:

  • To develop a novel, simultaneous measurement technique for temperature and emissivity.
  • To enable accurate characterization of diverse materials, including metals and semiconductors.
  • To enhance the precision of non-contact thermometry.

Main Methods:

  • Utilized a concave mirror setup for enhanced radiance measurement.
  • Employed a polarized radiometer for spectral radiance analysis.
  • Classified surface roughness parameter (α) into three categories for improved accuracy.

Main Results:

  • Achieved emissivity determination in the range of 0.1-0.9 with 8% variation.
  • Reported a combined standard uncertainty (u_c) of 6.0 K for temperature measurement at 800 K.
  • Demonstrated the method's effectiveness for various materials, including metals and semiconductors.

Conclusions:

  • The developed method offers a reliable approach for simultaneous temperature and emissivity measurement.
  • High zenith angle (75°) polarized spectral radiance measurements are key to the method's success.
  • This technique provides a valuable tool for materials characterization and thermal analysis.