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Projection-domain metal artifact correction using a dual layer detector.

Linxi Shi¹, N Robert Bennett¹, Josh Star-Lack²

¹Department of Radiology, Stanford University, Stanford, CA USA 94305.

Proceedings of Spie--The International Society for Optical Engineering

|July 12, 2021

Summary

This study introduces a new single-pass method using a dual-layer detector to reduce metal artifacts in cone-beam CT images. This approach effectively identifies and corrects metal, improving image quality, especially with truncated or moving metal objects.

Keywords:

Metal artifact cone-beam CT dual energy dual layer material decomposition projection domain

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Area of Science:

Medical Imaging
Cone-Beam CT Technology
Artifact Reduction

Background:

Metal artifacts pose a significant challenge in cone-beam CT (CBCT) imaging.
Existing two-pass metal artifact reduction methods struggle with off-center or moving metal objects and increase scan time.

Purpose of the Study:

To investigate a novel projection-based metal artifact detection and correction method.
To evaluate the efficacy of a dual-layer detector for improved metal artifact reduction in CBCT.

Main Methods:

Utilized a dual-layer detector to acquire dual-energy images with precise spatial and temporal registration.
Developed a single-pass, projection-domain algorithm for metal artifact detection and correction.
Evaluated the method using a phantom with metal wires (copper) and a steel needle, comparing dual-layer to single-layer scans.

Main Results:

The dual-layer detector facilitated enhanced identification of metal regions within projections.
Substantially reduced metal artifacts were observed in the reconstructed images compared to single-layer scans.
Demonstrated improved performance in handling metal outside the scan field-of-view and during motion.

Conclusions:

A single-pass, projection-domain metal artifact reduction method using a dual-layer detector is effective.
This method shows promise for robustness against metal truncation and motion artifacts in CBCT.
The dual-layer detector approach offers a more efficient and accurate solution for metal artifact challenges.