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Non-uniform illumination correction based on multi-scale Retinex in digital image correlation
Applied Optics
|July 15, 2021
Summary
Digital image correlation (DIC) accuracy improves with a new multi-scale Retinex algorithm that corrects non-uniform illumination in speckle images. This method enhances displacement and strain field measurements for better optical metrology.
Area of Science:
- Optical Measurement
- Digital Image Correlation (DIC)
- Image Processing
Background:
- Digital image correlation (DIC) measures displacement and strain fields by analyzing speckle images.
- Non-uniform illumination during image acquisition degrades DIC accuracy.
- Existing methods struggle with uneven lighting due to object size or light source variations.
Purpose of the Study:
- To introduce a multi-scale Retinex algorithm for correcting non-uniform illumination in DIC.
- To evaluate the impact of non-uniform illumination on DIC measurement accuracy.
- To validate the effectiveness of the proposed correction method in real-world experiments.
Main Methods:
- Numerical simulations of speckle images with varying non-uniform illumination.
- Application of a multi-scale Retinex algorithm for illumination correction.
- Experimental validation using rigid body rotation and uniaxial tensile tests.
Main Results:
- Non-uniform illumination significantly affects DIC measurement accuracy.
- The multi-scale Retinex algorithm effectively reduces or eliminates illumination non-uniformity.
- Experimental results demonstrate a significant improvement in DIC measurement accuracy after correction.
Conclusions:
- The multi-scale Retinex algorithm is a feasible and effective solution for non-uniform illumination in DIC.
- This correction method enhances the reliability and accuracy of optical measurement techniques.
- The study highlights the importance of addressing illumination variations for precise DIC analysis.

