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Tuning-fork-based piezoresponse force microscopy.

M Labardi1, S Capaccioli1,2,3

  • 1CNR-IPCF, Sede Secondaria di Pisa, c/o Physics Department, University of Pisa, Largo Pontecorvo 3, I-56127 Pisa, Italy.

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|July 20, 2021
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Summary
This summary is machine-generated.

Piezoresponse force microscopy (PFM) using quartz tuning-fork sensors overcomes electrostatic interference for accurate piezoelectric displacement measurements. This method enables reliable mapping of piezoelectric effects in various materials without side-effect complications.

Keywords:
piezoelectricitypiezoresponse force microscopyquartz tuning-fork

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Area of Science:

  • Materials Science
  • Nanotechnology
  • Physics

Background:

  • Piezoresponse force microscopy (PFM) detects picometer-scale surface displacements in piezoelectric materials.
  • Conventional PFM methods face challenges in absolute displacement determination due to mechanical and electrostatic side-effects.
  • Complex experimental or post-processing steps are often required for accurate piezoelectric coefficient measurements.

Purpose of the Study:

  • To develop a PFM method that eliminates electrostatic side-effects for precise measurement of piezoelectric displacements.
  • To enable absolute determination of piezoelectric coefficients without complex post-processing.
  • To demonstrate the efficacy of a new PFM approach on various ferroelectric materials.

Main Methods:

  • Utilizing quartz tuning-fork force sensors in an intermittent contact mode PFM setup.
  • Implementing a scanning probe method to map electrically-induced surface displacements.
  • Applying a DC electric potential to piezoelectric samples.

Main Results:

  • The quartz tuning-fork PFM method successfully measured electrically-induced surface displacements.
  • This approach proved immune to electrostatic side-effects common in cantilever-based PFM.
  • Reliable piezoeffect mapping was achieved on lithium niobate, triglycine sulfate, and PVDF polymers.
  • No influence from the applied DC electric potential was observed on the measurements.

Conclusions:

  • Quartz tuning-fork force sensors offer a robust solution for accurate PFM measurements.
  • This technique provides a simplified pathway to determine piezoelectric coefficients.
  • The method is broadly applicable to diverse ferroelectric materials, enhancing nanoscale electromechanical characterization.