Image processing metrics for phase identification of a multiaxis MEMS scanner used in single pixel imaging

Mayur Birla1, Xiyu Duan2, Haijun Li3

  • 1Department of Mechanical Engineering, University of Michigan, Ann Arbor, MI, 48109 USA.

IEEE/ASME Transactions on Mechatronics : a Joint Publication of the IEEE Industrial Electronics Society and the ASME Dynamic Systems and Control Division
|July 23, 2021
PubMed

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