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Updated: Oct 27, 2025

Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization
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Non-topographic current contrast in scanning field emission microscopy

G Bertolini1, O Gürlü1, R Pröbsting1

  • 1Laboratory for Solid State Physics, ETH Zurich, 8093 Zurich, Switzerland.

Royal Society Open Science
|July 23, 2021
PubMed

Keywords:
current–voltage characteristicsfield emissionscanning tunnelling microscopysurface imaging

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