Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Scanning Electron Microscopy01:07

Scanning Electron Microscopy

4.6K
A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
4.6K
Overview of Microscopy Techniques01:22

Overview of Microscopy Techniques

13.9K
The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...
13.9K
Transmission Electron Microscopy01:15

Transmission Electron Microscopy

6.2K
In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400...
6.2K
Atomic Force Microscopy01:08

Atomic Force Microscopy

3.8K
Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
3.8K

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Ultrafast Hopping Transfer Enables High-Anion Conduction.

Journal of the American Chemical Society·2026
Same author

Photon entanglement-enhanced multidimensional spectroscopy of exciton correlations in photosynthetic aggregates.

The Journal of chemical physics·2026
Same author

Probing histidine tautomers by theoretical X-ray absorption spectroscopy for biological and pathological studies.

Physical chemistry chemical physics : PCCP·2026
Same author

Intrinsic Chiroptical Evolution in Perovskite Nanocrystals.

The journal of physical chemistry letters·2026
Same author

A machine learning protocol for predicting structural distributions of amyloid-forming proteins from 2D IR spectra.

Proceedings of the National Academy of Sciences of the United States of America·2025
Same author

A foundation machine learning potential with polarizable long-range interactions for materials modelling.

Nature communications·2025

Related Experiment Video

Updated: Oct 27, 2025

Scanning-probe Single-electron Capacitance Spectroscopy
10:53

Scanning-probe Single-electron Capacitance Spectroscopy

Published on: July 30, 2013

13.2K

Carrier-Envelope-Phase Modulated Currents in Scanning Tunneling Microscopy.

Ziyang Hu1, YanHo Kwok1,2, GuanHua Chen1,3

  • 1Department of Chemistry, The University of Hong Kong, Pokfulam Road, Pokfulam, Hong Kong SAR.

Nano Letters
|July 23, 2021
PubMed
Summary

Carrier-envelope-phase (CEP) stable optical pulses enable precise control of ultrafast electronic tunneling currents. The phase shift observed in scanning tunneling microscopy (STM) is due to the third-order electric field response and pulse duration.

Keywords:
carrier-envelope phaseperturbative nonequilibrium Green’s functionsphase shiftscanning tunneling microscopytunneling control

More Related Videos

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
11:33

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Published on: January 19, 2018

10.0K
Probing the Structure and Dynamics of Interfacial Water with Scanning Tunneling Microscopy and Spectroscopy
10:28

Probing the Structure and Dynamics of Interfacial Water with Scanning Tunneling Microscopy and Spectroscopy

Published on: May 27, 2018

9.0K

Related Experiment Videos

Last Updated: Oct 27, 2025

Scanning-probe Single-electron Capacitance Spectroscopy
10:53

Scanning-probe Single-electron Capacitance Spectroscopy

Published on: July 30, 2013

13.2K
All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
11:33

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Published on: January 19, 2018

10.0K
Probing the Structure and Dynamics of Interfacial Water with Scanning Tunneling Microscopy and Spectroscopy
10:28

Probing the Structure and Dynamics of Interfacial Water with Scanning Tunneling Microscopy and Spectroscopy

Published on: May 27, 2018

9.0K

Area of Science:

  • Quantum tunneling
  • Ultrafast spectroscopy
  • Scanning tunneling microscopy

Background:

  • Carrier-envelope-phase (CEP) stable optical pulses are crucial for precise control of electronic processes.
  • Scanning tunneling microscopy (STM) allows for atomic-scale imaging and manipulation of electronic currents.

Purpose of the Study:

  • To theoretically investigate ultrafast electronic tunneling currents induced by CEP-stable optical pulses in STM.
  • To elucidate the origin of the phase shift between tunneling current and electric field.
  • To explore methods for manipulating tunneling currents using pulse properties.

Main Methods:

  • Nonequilibrium Green's function formalism.
  • Time and frequency domain theoretical analysis.
  • Modeling of tunneling currents between an STM tip and a metal substrate.

Main Results:

  • The phase shift is attributed to the third-order response of the tunneling current to the electric field.
  • The observed phase shift is sensitive to the duration of the CEP-stable optical pulses.
  • Theoretical predictions align with experimental observations of tunneling current dynamics.

Conclusions:

  • CEP-stable optical pulses offer a powerful tool for controlling ultrafast electronic tunneling.
  • The duration and phase of optical pulses can be used to precisely manipulate tunneling processes.
  • This work provides a theoretical foundation for advanced STM applications in ultrafast electron dynamics.