Impact of skull-to-brain conductivity ratio for high resolution EEG source localization

Objective. To measure the impact of skull-to-brain conductivity ratios on interictal spikes source localizations, using high resolution EEG (HR EEG). In previous studies, two ratios were mainly employed: 1/80 and 1/40. Consequences of the employed ratios on source localization results are poorly studied.Methods. Twenty patients with drug-resistant epilepsy were studied using HR EEG (sixty-four scalp electrodes). For each patient, three-layers realistic head models based on individual MRI were elaborated using boundary element model. For each interictal spike, source localization was performed six times, using six skull-to-brain conductivity ratios (1/80, 1/50, 1/40, 1/30, 1/20 and 1/10), exploring all the spectrum of values reported in the literature. We then measured distances between the different sources obtained and between the sources and the anterior commissure (in order to estimate sources depth).Results. We measured a mean distance of 5.3 mm (sd: 3 mm) between the sources obtained with 1/40 versus 1/80 ratio. This distance increased when the discrepancy between the two evaluated ratios increased. We measured a mean distance of 14.2 mm (sd: 4.9 mm) between sources obtained with 1/10 ratio versus 1/80 ratio. Sources localized using 1/40 ratio were 4.3 mm closer to the anterior commissure than sources localized using 1/80 ratio.Significance. Skull-to-brain conductivity ratio is an often-neglected parameter in source localization studies. The different ratios mainly used in the litterature (1/80 and 1/40) lead to significant differences in source localizations. These variations mainly occur in source depth. A more accurate estimation of skull-to-brain conductivity is needed to increase source localization accuracy.Abbreviations. ECD: equivalent current dipole; EIT: electric impedance tomography, HR EEG: High resolution Electroencephalography, IIS: Inter ictal spikes, MEG: Magnetoencephalography, MRI: Magnetic resonance imaging, mS/m: milli-Siemens/m, S/m: Siemens/m, SD: Standard deviation.