Defect localization by an extended laser source on a hemisphere.

Daniel Veira Canle1, Joni Mäkinen2, Richard Blomqvist2

  • 1Department of Physics, Division of Material Physics, Faculty of Science, University of Helsinki, P.O.B. 64, 00014, Helsinki, Finland. daniel.veiracanle@helsinki.fi.

Scientific Reports
|July 27, 2021
PubMed
Summary

This study uses a laser line source to locate defects in curved shapes. The method successfully identified a pit in a steel hemisphere, enabling contactless inspection for medical implants.