Biasing of Metal-Semiconductor Junctions
Joule-Thomson Effect
Metal-Semiconductor Junctions
Biasing of P-N Junction
Non-ohmic Devices
P-N junction
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High-resolution Thermal Micro-imaging Using Europium Chelate Luminescent Coatings
Published on: April 16, 2017
O V Skryabina1,2,3, S V Bakurskiy4,5,6, A G Shishkin4,6
1Institute of Solid State Physics RAS, Chernogolovka, Russia, 142432. oskrya@gmail.com.
Electron bath overheating significantly impacts critical current in nanowire Josephson junctions. Understanding this influence allows for better control of superconducting devices through electron gas overheating effects.
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