Direct Visualization and Manipulation of Stacking Orders in Few-Layer Graphene by Dynamic Atomic Force Microscopy

Area of Science:

• Materials Science
• Condensed Matter Physics
• Nanotechnology

Background:

• Stacking order significantly influences properties of 2D materials.
• Few-layer graphene exhibits distinct electronic properties based on ABA and ABC stacking.
• Controllable characterization and manipulation of stacking configurations remain challenging.

Purpose of the Study:

• To develop a high-resolution method for visualizing stacking order in few-layer graphene.
• To demonstrate controllable manipulation of stacking domains and domain walls.
• To provide a reliable strategy for imaging and controlling atomic structures in 2D materials.

Main Methods:

• Tapping-mode atomic force microscopy (AFM) in phase imaging mode.
• Utilizing differences in tip-sample energy dissipation for contrast.
• Generating stress transverse waves with the AFM tip for manipulation.

Main Results:

• Direct visualization of ABA- and ABC-stacked domains with high spatial resolution.
• Phase contrast in AFM imaging directly correlates with stacking configurations.
• Controllable manipulation of ABA/ABC domain walls achieved via AFM tip-induced stress waves.

Conclusions:

• Atomic force microscopy offers a superior method for imaging graphene stacking compared to optical spectroscopy.
• AFM enables precise, localized control over stacking domain boundaries.
• This approach is extendable to other layered two-dimensional materials for structural engineering.