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Fluorescence intensity correlation imaging with high spatial resolution and elemental contrast using intense x-ray
Phay J Ho1, Christopher Knight2, Linda Young
1Chemical Sciences and Engineering Division, Argonne National Laboratory, Lemont, Illinois 60439, USA.
Structural Dynamics (Melville, N.Y.)
|August 9, 2021
Summary
We explored fluorescence intensity correlation (FIC) for high-resolution imaging using X-ray free-electron laser pulses. Few-femtosecond pulses are sufficient for FIC, while sub-femtosecond pulses benefit coherent diffractive imaging (CDI).
Area of Science:
- Atomic and Molecular Physics
- Materials Science
- Nanotechnology
Background:
- High-resolution imaging and elemental contrast are crucial for understanding material structures.
- X-ray free-electron lasers (XFELs) offer intense ultrashort pulses for probing matter.
- Fluorescence intensity correlation (FIC) and coherent diffractive imaging (CDI) are advanced imaging techniques.
Purpose of the Study:
- To theoretically investigate the fluorescence intensity correlation (FIC) of Argon (Ar) clusters and Molybdenum (Mo)-doped iron oxide nanoparticles.
- To assess the feasibility of using FIC with femtosecond and sub-femtosecond XFEL pulses for high-resolution imaging.
- To compare the effectiveness of FIC with CDI for retrieving structural information and imaging dopant distributions.
Main Methods:
- Theoretical investigation of fluorescence intensity correlation (FIC).
- Simulation of interactions between ultrashort XFEL pulses (femtosecond and sub-femtosecond) and Ar clusters.
- Analysis of Mo K-edge fluorescence from Mo-doped iron oxide nanoparticles.
- Comparison of structural information obtained from FIC and coherent diffractive imaging (CDI).
Main Results:
- Few-femtosecond XFEL pulses are potentially sufficient for high-resolution imaging using FIC.
- Sub-femtosecond pulses offer significant advantages for the CDI approach.
- FIC, utilizing Mo fluorescence, can effectively image dopant distributions in nanoparticles in the nonresonant regime.
Conclusions:
- FIC is a promising technique for high-resolution structural imaging, particularly with few-femtosecond XFEL pulses.
- The choice of pulse duration is critical, with sub-femtosecond pulses being more beneficial for CDI.
- FIC provides a viable method for mapping elemental distributions in doped nanomaterials.
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