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High-Throughput Total Internal Reflection Fluorescence and Direct Stochastic Optical Reconstruction Microscopy Using a Photonic Chip
Published on: November 16, 2019
Guillermo Cosarinsky1,2,3, Jorge Fernandez-Cruza1,4, Jorge Camacho1
1Ultrasound Systems and Technology Group (GSTU), Institute for Physical and Information Technologies (ITEFI), Spanish National Research Council (CSIC), c/Serrano 144, 28006 Madrid, Spain.
Plane Wave Imaging (PWI) enables rapid Non-Destructive Testing (NDT) by using fewer emissions. This study adapts PWI for complex geometries, maintaining image quality for improved defect detection.
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