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Updated: Oct 25, 2025

Implementation of a Reference Interferometer for Nanodetection
Published on: April 26, 2014
Pragmatic Micrometre to Millimetre Calibration Using Multiple Methods for Low-Coherence Interferometer in Embedded
Tom Hovell1, Jon Petzing1, Laura Justham1
1Wolfson School of Mechanical, Electrical and Manufacturing Engineering, Loughborough University, Loughborough LE11 3TU, UK.
Abstract:
In-situ metrology utilised for surface topography, texture and form analysis along with quality control processes requires a high-level of reliability. Hence, a traceable method for calibrating the measurement system's transfer function is required at regular intervals. This paper compares three methods of dimensional calibration for a spectral domain low coherence interferometer using a reference laser interferometer versus two types of single material measure. Additionally, the impact of dataset sparsity is shown along with the effect of using a singular calibration dataset for system performance when operating across different media.
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