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Updated: Oct 23, 2025

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Microscopic Evidence for Spatially Inhomogeneous Charge Trapping in Pentacene
1Laboratory of Atomic and Solid State Physics, Cornell University, Ithaca, NY 14853-2501, USA.
Abstract:
Charge traps in pentacene thin-film transistors (Figure, left) have been imaged using electric force microscopy. The Figure shows a map of the trap distribution just below (middle) and well above (right) the transistor threshold voltage. It is found that the long-lived charge traps in polycrystalline pentacene are distributed inhomogeneously and do not appear to be associated with grain boundaries, as is generally assumed.
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