Trapped Electrons and Ions as Particle Detectors

Daniel Carney1, Hartmut Häffner2, David C Moore3

  • 1Physics Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA.

Physical Review Letters
|August 23, 2021
PubMed
Summary

Trapped charged particles in electromagnetic fields can detect low-energy particles and dark matter. These quantum systems offer high sensitivity for particle physics and quantum computing noise characterization.

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