Electronic Modulation Caused by Interfacial Ni-O-M (M=Ru, Ir, Pd) Bonding for Accelerating Hydrogen Evolution

Liming Deng1, Feng Hu1, Mingyue Ma1

  • 1College of Materials Science and Technology, Nanjing University of Aeronautics and Astronautics, Nanjing, 210016, China.