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GIDInd: an automated indexing software for grazing-incidence X-ray diffraction data
Manuel Peter Kainz1, Lukas Legenstein1, Valentin Holzer1
1Institute of Solid State Physics, Graz University of Technology, Petersgasse 16, Graz, 8010, Austria.
A new software, GIDInd, automates the indexing of grazing-incidence X-ray diffraction (GIXD) patterns for thin film characterization. This tool aids in identifying crystal phases and discovering new polymorphs, simplifying crystallographic analysis.
Area of Science:
- Materials Science
- Crystallography
- Solid-State Physics
Background:
- Grazing-incidence X-ray diffraction (GIXD) is crucial for characterizing thin films.
- Indexing diffraction patterns is essential for phase identification and polymorph discovery.
- Existing methods for indexing GIXD patterns are limited.
Purpose of the Study:
- To introduce GIDInd, an automated software for indexing GIXD patterns.
- To implement an advanced mathematical framework for GIXD data analysis.
- To provide a user-friendly tool for crystallographic characterization of thin films.
Main Methods:
- Development of GIDInd software based on a triclinic unit cell assumption.
- Implementation of two indexing approaches: GIXD peaks only, and GIXD with specular diffraction peaks.
- Numerical optimization of unit-cell solutions and reduction to standard crystallographic conventions.
Main Results:
- Successful implementation of an automated indexing software (GIDInd).
- Demonstration of GIDInd's efficacy on two distinct thin organic film samples.
- Provision of a user-friendly graphical interface for the MATLAB executable.
Conclusions:
- GIDInd offers an efficient and automated solution for indexing GIXD patterns.
- The software facilitates the crystallographic characterization of thin films.
- GIDInd aids in the discovery of unknown polymorphs and identification of specific phases.
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