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Atomic emission spectroscopy (AES) is an analytical technique used to determine the elemental composition of a sample by analyzing the light emitted from excited atoms. In AES, atoms in a sample are excited to higher energy levels by thermal energy from high-temperature sources, such as plasma, arcs, or sparks. When these excited atoms return to lower energy states, they emit light at specific wavelengths characteristic of each element. The resulting atomic emission spectrum, which consists of...

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Related Experiment Video

Updated: Oct 22, 2025

An Experimental Protocol for Femtosecond NIR/UV - XUV Pump-Probe Experiments with Free-Electron Lasers

An Experimental Protocol for Femtosecond NIR/UV - XUV Pump-Probe Experiments with Free-Electron Lasers

Published on: October 23, 2018

Study on X-ray Emission Using Ultrashort Pulsed Lasers in Materials Processing.

Joerg Schille¹, Sebastian Kraft¹, Theo Pflug¹

¹Laserinstitut Hochschule Mittweida, University of Applied Sciences Mittweida, Technikumplatz 17, 09648 Mittweida, Germany.

Materials (Basel, Switzerland)

|August 27, 2021

Summary

High-intensity ultrashort laser pulses can generate significant X-ray emissions, posing health risks. Optimizing laser parameters like pulse distance and repetition frequency is crucial for managing these unexpected X-ray photon fluxes.

Keywords:

Bremsstrahlung X-ray bi-burst burst dose rate laser plasma resonance absorption ultrashort pulse

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Area of Science:

Physics
Materials Science
Laser Technology

Background:

Ultrashort pulsed laser interactions with materials can unexpectedly produce high X-ray photon flux.
Increasing laser power correlates with higher X-ray emissions, posing health risks to operators.
Operational conditions significantly influence spectral X-ray photon flux and dose.

Purpose of the Study:

To investigate laser-induced X-ray emissions under various ultrashort pulse laser conditions.
To quantify X-ray emission dose rates and spectral characteristics.
To understand the impact of laser parameters on X-ray generation.

Main Methods:

Utilized four ultrashort pulse laser systems with varying beam characteristics.
Investigated peak intensities from 8 × 10^12 W/cm^2 to 5.2 × 10^16 W/cm^2.
Examined average laser power up to 72.2 W and burst/bi-burst processing modes.

Main Results:

X-ray emission dose rates exceeding 45 mSv/h were observed with AISI 304 stainless steel under specific conditions (1 µm intra-line pulse distance, MHz repetition frequencies).
Low-intensity ultrashort pulses at small intra-line distances during laser scanning significantly increased X-ray emission dose rates.
The second intra-burst pulse in burst and bi-burst modes notably enhanced X-ray emissions.

Conclusions:

Precise control over laser parameters, including pulse distance and repetition frequency, is critical for managing X-ray emissions.
Burst and bi-burst pulse configurations require careful consideration due to their potential to amplify X-ray generation.
Further research is needed to fully characterize and mitigate risks associated with laser-induced X-ray production.