Fiber-tip polymer clamped-beam probe for high-sensitivity nanoforce measurements

Mengqiang Zou1,2, Changrui Liao3,4, Shen Liu1,2

  • 1Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education/GuangDong Province, College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen, 518060, China.