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Updated: Oct 21, 2025

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Mathematical estimation of half-value layer thicknesses.

Farid H Omoumi1, Xizeng Wu2, Muhammad U Ghani1

  • 1The School of Electrical and Computer Engineering, The University of Oklahoma, Norman, Oklahoma, USA.

Journal of Applied Clinical Medical Physics
|September 1, 2021
PubMed
Summary
This summary is machine-generated.

A new method accurately estimates X-ray beam quality parameters like half-value layer (HVL) from spectra. This simplified approach offers a faster, more reliable alternative for diagnostic radiology and radiotherapy applications.

Keywords:
half-value layerquarter-value layertenth-value layerx-ray spectrum

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Area of Science:

  • Medical Physics
  • Radiological Physics
  • Radiation Dosimetry

Background:

  • Half-value layer (HVL), quarter-value layer (QVL), and tenth-value layer (TVL) are critical for characterizing X-ray beam quality.
  • Conventional measurement of these parameters can be technically challenging, time-consuming, and prone to uncertainty.

Purpose of the Study:

  • To introduce a simplified and rapid method for estimating HVL, QVL, and TVL.
  • To validate this method using both measured and simulated X-ray spectra from diagnostic and kV radiotherapy sources.

Main Methods:

  • X-ray spectra were measured using a CdTe detector and simulated using SpekCalc GUI software.
  • A novel mathematical method was employed to compute HVL from the spectra.
  • Computed HVL values were compared against experimental measurements using an ionization chamber and aluminum attenuators.

Main Results:

  • The study demonstrated acceptable concordance between computed and measured HVL, QVL, and TVL values.
  • Discrepancies in HVL measurements ranged from 10 to 90 micrometers of Aluminum across a tube potential range of 31 kV to 120 kV.
  • Negligible differences were observed between analytical estimations and experimental assessments.

Conclusions:

  • The developed method provides a fast, convenient, and reliable technique for estimating X-ray beam quality parameters.
  • This approach offers a valuable alternative to conventional measurement methods, especially when technical challenges exist.
  • The findings support the utility of spectral analysis for efficient characterization of X-ray beams in medical applications.