Related Experiment Video
Updated: Oct 21, 2025

Dynamic Pore-scale Reservoir-condition Imaging of Reaction in Carbonates Using Synchrotron Fast Tomography
Published on: February 21, 2017
Double-filter high-resolution soft x-ray tomographic diagnostic for investigating electron acceleration in TS-6
Junguang Xiang1, Shinjiro Takeda1, Yunhan Cai1
1Graduate School of Engineering, The University of Tokyo, Tokyo 113-0032, Japan.
Abstract:
An innovative tangential-view soft x-ray (SXR) tomographic imaging measurement was developed on the TS-6 spherical tokamak merging device as a key diagnostic for investigating the mechanism of electron acceleration. In order to measure SXR with different energy ranges, two micro-channel plates (MCPs) are, respectively, installed in two vacuum chambers, which are equipped with different filters. Especially designed lenses and fiber bundles serve as an optical system to transfer images from phosphor plates of MCPs to a high speed imaging system. This design also enables us to simultaneously measure two images appearing on phosphor plates of MCPs by just one high speed imaging system. The temporal and spatial resolution of this diagnostic can be up to 5 µs and 4 mm, respectively, at present. The tomographic method based on the Phillips-Tikhonov regularization is employed to reconstruct line-integrated images into the local emissivity of SXR, which reflects the spatial distribution of high-energy electrons. Owing to this diagnostic, we successfully measured SXR emitted from the downstream region of magnetic reconnection in TS-6 merging experiments for the first time. The energy range of SXR turned out to be higher than 100 eV but lower than 400 eV.
More Related Videos
Related Concept Videos
Electron Microscope Tomography and Single-particle Reconstruction
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...
X-ray Imaging
Transmission Electron Microscopy

