EM-based algorithms for single particle tracking of Ornstein-Uhlenbeck motion from sCMOS camera data

Ye Lin1, Sean B Andersson1,2

  • 1Division of Systems Engineering, Boston, MA 02215, USA.

Proceedings of the ... American Control Conference. American Control Conference
|September 6, 2021
PubMed
Summary

We present Expectation Maximization (EM) algorithms for single particle tracking (SPT) localization and parameter estimation using sCMOS camera data. Two methods, Sequential Monte Carlo - EM and Unscented - EM, are evaluated for accuracy and efficiency.

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