Deep-Compact-Clustering Based Anomaly Detection Applied to Electromechanical Industrial Systems.

Francisco Arellano-Espitia1, Miguel Delgado-Prieto1, Artvin-Darien Gonzalez-Abreu2

  • 1MCIA Department of Electronic Engineering, Technical University of Catalonia (UPC), 08034 Barcelona, Spain.

Sensors (Basel, Switzerland)
|September 10, 2021
PubMed
Summary

A new deep-autoencoder-compact-clustering one-class support-vector machine (DAECC-OC-SVM) method accurately detects unknown machinery faults. This unsupervised framework improves anomaly detection in complex industrial systems.

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