Raman and X-ray photoelectron spectroscopic investigation of solution processed Alq3/ZnO hybrid thin films
Gnyaneshwar Dasi1, Thyda Lavanya1, S Suneetha1
1Organic Optoelectronic Device Lab, Department of Physics, National Institute of Technology, Warangal 506004, Telangana, India.
Abstract:
In this study, we characterize the solution processed tris-(8-hydroxyquinoline)aluminum(Alq3)/ZnO hybrid thin films using Raman and X-ray photoelectron spectroscopic (XPS) techniques. Raman studies reveal the sol-gel derived spin-coated ZnO thin film has hexagonal wurtzite structure. The incorporation of Alq3 molecules in the hybrid film results in the formation of bonding onto the surface of highly crystalline ZnO nanoparticles. The XPS confirms the incorporation of Alq3 in the hybrid thin films and corroborates that the Alq3 molecules may be adsorbed onto the surface of ZnO nanoparticles (chemisorption), showing the existence of chemical interaction between Alq3 and ZnO in the hybrid films. These studies support that the chemisorbed Alq3 molecules onto the ZnO nanoparticles may facilitate the charge transfer (non-radiative) between Alq3 and ZnO in the hybrid thin films which will be useful to enhance the optical and electrical properties for the optoelectronic device applications.
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