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Development of an Energy-Sensitive Detector for the Atom Probe Tomography.

Christian Bacchi1, Gérald Da Costa1, Emmanuel Cadel1

  • 1Normandie Université, UNIROUEN, INSA Rouen, CNRS, Groupe de Physique des Matériaux, 76000Rouen, France.

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Summary

A novel detector for atom probe tomography (APT) uses secondary electrons from carbon foils to distinguish particle energies. This innovation aims to resolve mass peak overlaps in critical materials analysis.

Keywords:
atom probe tomographycarbon foilmass peak overlapsposition-energy-sensitive detector

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Area of Science:

  • Materials Science
  • Analytical Chemistry
  • Physics

Background:

  • Atom probe tomography (APT) faces challenges with mass peak overlaps, complicating analysis of critical materials.
  • Overlapping mass peaks, such as N/Si in TiSiN or Ti/C in cemented carbides, hinder accurate material characterization.
  • Existing APT detectors struggle to differentiate between ions with similar mass-to-charge ratios.

Purpose of the Study:

  • To develop a new energy-sensitive detector for APT instruments.
  • To address and resolve mass peak overlap issues in APT experiments.
  • To introduce a novel method for discriminating particle energies based on secondary electron generation.

Main Methods:

  • Integration of a thin carbon foil onto a conventional Microchannel Plate-Delay Line Detector (MCP-DLD).
  • Exploitation of secondary electron emission generated by ion impact on the carbon foil.
  • Analysis of the relationship between secondary electron yield, ion kinetic energy, and ion mass.

Main Results:

  • Demonstrated that secondary electron yield from carbon foils is dependent on ion kinetic energy and mass.
  • Established the principle of using energy-dependent secondary electron generation for particle discrimination.
  • Paved the way for enhanced resolution in APT analysis of complex materials.

Conclusions:

  • The developed detector offers a potential solution for resolving mass peak overlaps in APT.
  • This energy-sensitive approach represents a significant advancement for critical materials analysis.
  • The study introduces a new generation of APT detectors with improved analytical capabilities.