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Toward Robust Fault Identification of Complex Industrial Processes Using Stacked Sparse-Denoising Autoencoder With
This study introduces a deep learning fault recognition method (SSDAE-Softmax) for complex industrial processes. It effectively identifies faults and handles noise, improving process monitoring accuracy.
Area of Science:
- Industrial Process Monitoring
- Artificial Intelligence
- Machine Learning
Background:
- Complex industrial processes (CIPs) require accurate fault identification for safe and efficient operation.
- Traditional methods struggle with noise and complex data patterns in CIP monitoring data (CIPMD).
- Deep learning offers potential for robust feature extraction from noisy industrial data.
Purpose of the Study:
- To propose a robust end-to-end deep learning fault recognition scheme for CIPs.
- To develop a stacked sparse-denoising autoencoder (SSDAE)-Softmax model for accurate fault identification.
- To optimize the model using the state transition algorithm (STA) for enhanced performance.
Main Methods:
- Integrating sparse autoencoder (SAE) and denoising autoencoder (DAE) into sparse denoising autoencoder (SDAE) for feature representation.
- Stacking multiple SDAEs with layerwise pretraining and a Softmax classifier for the SSDAE-Softmax model.
- Employing the state transition algorithm (STA) for hyperparameter optimization of the SSDAE-Softmax model.
Main Results:
- The SSDAE-Softmax model demonstrated effective identification of various process faults in simulation and real-world industrial systems (TEP and CCP).
- The proposed method showed strong robustness and adaptability against noise interference in CIPMD.
- Deep learning-based feature representation combined with STA optimization enabled adaptive learning of intrinsic data characteristics.
Conclusions:
- The SSDAE-Softmax model provides an effective solution for fault recognition in complex industrial processes.
- The method exhibits superior robustness and adaptability to noise, crucial for real-world industrial monitoring.
- This deep learning approach enhances the accuracy and reliability of fault identification in CIPs.
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