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Updated: Jul 28, 2026
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Fabrication of Uniform Nanoscale Cavities via Silicon Direct Wafer Bonding
Published on: January 9, 2014
A Density Comparison of Silicon Artifacts Between NML (Australia) and NBS (U.S.)
1National Measurement Laboratory, P. O. Box 218 Lindfield, NSW 2070, Australia.
Journal of Research of the National Bureau of Standards (1977)
|September 27, 2021
Abstract:
The densities of four silicon artifacts were measured in SI units to 1 × 10-6 by NML (Australia) and NBS (U.S.). Agreement is within the experimental uncertainty of each laboratory. Two of the artifacts had been used in the determination of the Avogadro constant at NBS. The remaining two objects had been used at NBS to establish silicon density artifacts available as a Standard Reference Material (SRM).
