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Updated: Oct 18, 2025

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
Published on: June 19, 2018
Prism-based scanning X-ray microscopy
1National Synchrotron Light Source II, Brookhaven National Laboratory, Building 743, PO Box 5000, Upton, NY 11973-5000, USA.
Abstract:
A commentary is provided on a new type of prism deflection scanning X-ray microscope, providing context and some future potential applications of this new type of microscope.
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