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Non-contact imaging of subsurface defects using a scanning laser source.

Takahiro Hayashi1, Naoki Mori1, Tomotake Ueno1

  • 1Department of Mechanical Engineering, Graduate School of Engineering, Osaka University, Suita, Osaka 565-0871, Japan.

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Summary

This study demonstrates laser-excited ultrasonic waves for detecting small subsurface defects in additive manufacturing (AM) components. Optimizing the testing frequency range to include local defect resonant (LDR) frequencies is crucial for effective nondestructive inspection.

Keywords:
Defect imagingLaser ultrasonicsScanning laser sourceSubsurface defects

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Area of Science:

  • Materials Science
  • Nondestructive Testing
  • Additive Manufacturing

Background:

  • Ensuring the quality of additive manufacturing (AM) components is vital for their widespread application.
  • Nondestructive inspection (NDI) technologies are essential for guaranteeing AM component integrity.
  • Subsurface defects in AM parts pose a significant challenge to quality control.

Purpose of the Study:

  • To investigate a novel method for detecting subsurface defects in AM components using laser-excited ultrasonic waves.
  • To establish guidelines for optimizing defect detection based on resonant frequencies.
  • To improve the sensitivity of NDI for detecting smaller defects in AM parts.

Main Methods:

  • Excitation of wideband ultrasonic waves using high-repetition laser pulses.
  • Utilizing a scanning laser source (SLS) with broadband waves for defect imaging.
  • Employing finite element analysis to understand defect-frequency relationships.

Main Results:

  • Successful excitation of wideband ultrasonic waves with a good signal-to-noise ratio.
  • Acquisition of clear images of subsurface defects in an aluminum alloy plate.
  • Detection of AM-created subsurface circular defects with diameters below 1.0 mm, previously undetectable.
  • Identification of local defect resonant (LDR) frequencies as critical for imaging conditions.

Conclusions:

  • Laser-excited ultrasonic waves offer a promising NDI method for AM components.
  • The imaging technique's effectiveness is strongly linked to the local defect resonant (LDR) frequency.
  • A key guideline for effective defect detection is to ensure the tested frequency range encompasses the LDR frequencies of targeted defects.