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Updated: Oct 18, 2025

3D Depth Profile Reconstruction of Segregated Impurities Using Secondary Ion Mass Spectrometry
Published on: April 29, 2020
Bricker Ostler1, Nikolai Yampolsky1, Quinn Marksteiner1
1Los Alamos National Laboratory, Los Alamos, New Mexico 87545, USA.
Accurately reconstructing electron bunch profiles is crucial for advanced accelerators. This study analyzes frequency domain techniques, identifying the most reliable method for profile reconstruction from spectroscopic data.
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