A novel micro-tensile system for full-field deformation measurement of thin films

We propose a novel micro-tensile system fit for mechanical property characterization of low-dimensional materials. The micro-tensile system was integrated with a micro-tensile apparatus driven by a piezoelectric transducer (PZT) and an optical microscope. The displacement provided by the PZT actuator was amplified by a lever structure on the micro-tensile apparatus. A stalloy was designed to transmit the displacement and reduce the mechanical resistance to the PZT actuator. Quantitative analysis was conducted for the designed apparatus. A calibration experiment was performed based on the micro-scale digital image correlation under the optical microscope. To validate the feasibility, the PET film specimen with a V-notch was tested by the proposed system. The results indicate that the proposed micro-tensile system is reliable and powerful.