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Two characterization methods of ripple errors for the large square aperture.

Wenhui Fei, Lei Zhao, Jian Bai

|October 6, 2021

Summary

This study introduces new methods to quantify mid-spatial-frequency (MSF) ripple errors in large-aperture optics. These techniques enable better prediction of performance degradation and guide optical fabrication processes.

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Area of Science:

Optical Engineering
Materials Science
Laser Technology

Background:

Mid-spatial-frequency (MSF) ripples are critical error sources in large-aperture optical elements for high-power laser systems.
Accurate characterization of these errors is essential for predicting performance degradation and optimizing fabrication.

Purpose of the Study:

To develop and present robust quantitative methods for characterizing MSF ripple errors in large-square-aperture optics.
To advance from qualitative assessment to quantitative analysis of surface error parameters.

Main Methods:

Introduction of cross artifact reduction technology for power spectral density analysis to mitigate spectrum leakage.
Development of an efficient algorithm for generating Legendre moments of two-dimensional Legendre polynomials to quantify ripple errors.

Main Results:

Successfully quantified residual periodic surface undulations (ripple errors) in large square apertures.
Demonstrated improved spectral analysis by suppressing leakage while preserving critical data.

Conclusions:

The proposed methods offer a simple and robust approach to characterizing MSF ripple errors.
This work facilitates the association of optical design parameters with surface error descriptions for improved performance prediction.