Electronic Distance Measuring Instruments
One-Degree-of-Freedom System
You might also read
Articles linked to this work by shared authors, journal, and citation graph.
Updated: Oct 17, 2025

Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization
Published on: July 5, 2016
This study presents a simplified, cost-effective optical frequency domain reflectometry (OFDR) system using semiconductor lasers. The innovative design eliminates the need for an auxiliary interferometer, enhancing accuracy and reducing complexity for fiber optic sensing applications.
Area of Science:
Background:
Purpose of the Study:
Main Methods:
Main Results:
Conclusions: