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There are two main infrared (IR) spectrophotometers: dispersive IR spectrometers and Fourier transform infrared (FTIR) spectrometers. In a dispersive IR spectrometer, a beam of infrared radiation produced by a hot wire is divided into two parallel equal-intensity beams using mirrors. One beam passes through the sample, while another is a reference beam. The beams then move through the monochromator, which separates the radiations into a continuous spectrum of different frequencies. The...

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Updated: Oct 17, 2025

Implementation of a Reference Interferometer for Nanodetection

Implementation of a Reference Interferometer for Nanodetection

Published on: April 26, 2014

Frequency-comb-calibrated swept-wavelength interferometry.

Krishna Twayana, Zhichao Ye, Óskar B Helgason

|October 7, 2021

Summary

This summary is machine-generated.

A frequency comb calibrates tunable lasers for precise optical measurements. This enables high-resolution spectroscopy for characterizing integrated photonic devices and waveguides.

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Last Updated: Oct 17, 2025

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Area of Science:

Optics and Photonics
Spectroscopy
Metrology

Background:

Lasers enable non-destructive sample characterization by measuring amplitude and phase changes.
Swept wavelength interferometry (SWI) uses tunable lasers for complex optical response measurement, crucial for sensing and bioimaging.
A key challenge in SWI is the non-constant tuning rate of lasers, necessitating calibration.

Purpose of the Study:

To develop a calibration method for tunable lasers used in SWI and optical frequency domain reflectometry (OFDR).
To enable high-resolution complex spectroscopy over a broad bandwidth (>10 THz).
To apply the calibrated technique for characterizing integrated photonic devices.

Main Methods:

Utilizing a self-referenced frequency comb as an optical ruler for laser calibration.
Implementing the calibrated laser in SWI and OFDR setups.
Applying the technique to characterize microresonators and spiral waveguides.

Main Results:

Achieved high-resolution complex spectroscopy over a >10 THz bandwidth.
Successfully characterized low-loss integrated photonic devices.
Demonstrated phase information's ability to distinguish intrinsic from coupling losses in high-Q microresonators.
Resolved attenuation and dispersion in integrated spiral waveguides using reflection mode OFDR.

Conclusions:

A frequency comb-based calibration method enhances tunable laser accuracy for SWI and OFDR.
This technique provides precise characterization of integrated photonic devices, including loss analysis.
The method is versatile, applicable to both transmission and reflection measurements for optical components.