X-ray Diffraction of Biological Samples
X-ray Crystallography
Scanning Electron Microscopy
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Updated: Oct 17, 2025

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
Yitian Shen1,2, Yongsheng Zhang1,2, Wei Li3
1The State Key Lab of High Performance Ceramics and Superfine Microstructure, Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai, China.
This study introduces a new local band detection method to improve the accuracy of indexing Kikuchi patterns from low-quality electron backscatter diffraction (EBSD) data. The technique enhances the extraction of partially missing Kikuchi bands, leading to more precise EBSD maps.
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