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Local Kikuchi band detection in electron backscatter diffraction patterns for enhanced pattern indexing.

Yitian Shen1,2, Yongsheng Zhang1,2, Wei Li3

  • 1The State Key Lab of High Performance Ceramics and Superfine Microstructure, Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai, China.

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|October 11, 2021
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Summary
This summary is machine-generated.

This study introduces a new local band detection method to improve the accuracy of indexing Kikuchi patterns from low-quality electron backscatter diffraction (EBSD) data. The technique enhances the extraction of partially missing Kikuchi bands, leading to more precise EBSD maps.

Keywords:
electron backscatter diffraction (EBSD)grey gradientlocal Kikuchi band detectionmean angular deviation

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Area of Science:

  • Materials Science
  • Crystallography
  • Image Analysis

Background:

  • Indexing Kikuchi patterns is crucial for electron backscatter diffraction (EBSD) mapping.
  • Partially missing Kikuchi bands in low-quality patterns reduce EBSD map accuracy.
  • Existing Hough transform methods struggle with incomplete band data.

Purpose of the Study:

  • To propose a novel local band detection method for accurately extracting Kikuchi bands from low-quality EBSD patterns.
  • To improve the accuracy of EBSD pattern indexing and the quality of EBSD maps.
  • To address the limitations of traditional Hough transform methods in handling incomplete Kikuchi bands.

Main Methods:

  • Developed a local band detection approach for low-quality Kikuchi patterns.
  • Rotated bands to a vertical orientation for enhanced detection.
  • Utilized largest horizontal average grey gradient with a 400-pixel vertical interval.
  • Applied Hough transform and weighted averaging to unify band edges.

Main Results:

  • The proposed method accurately extracts entire Kikuchi bands even when partially visible.
  • Achieved a 29.0% reduction in average interplanar angle error compared to Hough transform.
  • Demonstrated a 38.5% lower average mean angular deviation (MAD) than Hough transform-based techniques.

Conclusions:

  • The novel local band detection method significantly improves EBSD pattern analysis.
  • This technique is effective for post-processing and re-indexing low-quality EBSD patterns.
  • Enhanced accuracy in EBSD mapping is achieved, enabling more reliable material characterization.