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Related Concept Videos

Atomic Emission Spectroscopy: Lab01:29

Atomic Emission Spectroscopy: Lab

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AES is a powerful analytical technique, especially effective when used with plasma sources, producing abundant spectra in characteristic emission lines. The Inductively Coupled Plasma (ICP), in particular, yields superior quantitative analytical data due to its high stability, low noise, low background, and minimal interferences under optimal experimental conditions. However, newer air-operated microwave sources are emerging as promising alternatives that could be more cost-effective than...
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A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
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The instrumentation of atomic emission spectrometry (AES) involves various components, including atomization devices that convert samples into gas-phase atoms and ions. There are two main types of atomization devices: continuous and discrete atomizers.  Continuous atomizers, like plasmas and flames, introduce samples in a constant stream, while discrete atomizers inject individual samples using syringes or autosamplers. The most common discrete atomizer is the electrothermal atomizer.
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Atomic emission spectroscopy (AES) is an analytical technique used to determine the elemental composition of a sample by analyzing the light emitted from excited atoms. In AES, atoms in a sample are excited to higher energy levels by thermal energy from high-temperature sources, such as plasma, arcs, or sparks. When these excited atoms return to lower energy states, they emit light at specific wavelengths characteristic of each element. The resulting atomic emission spectrum, which consists of...
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Preparing a Celadonite Electron Source and Estimating Its Brightness
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Stable field-emission from a CeB6 nanoneedle point electron source.

Shuai Tang1, Jie Tang1,2, Yimeng Wu1,2

  • 1National Institute for Materials Science, Tsukuba, Ibaraki 305-0047, Japan. tang.jie@nims.go.jp.

Nanoscale
|October 12, 2021
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Summary

A novel cerium hexaboride (CeB6) nanoneedle was fabricated for electron emission. This stable field emission source is ideal for microscopy applications.

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Area of Science:

  • Materials Science
  • Condensed Matter Physics

Background:

  • Field emission electron sources are crucial for various applications, including microscopy.
  • Developing stable and efficient electron emitters remains a key challenge.

Purpose of the Study:

  • To fabricate a single CeB6 nanoneedle structure.
  • To evaluate its field emission characteristics and potential for microscopy.

Main Methods:

  • Focused Ion Beam (FIB) fabrication of a single CeB6 nanoneedle.
  • Characterization of field emission properties, including current stability and electric field requirements.

Main Results:

  • Fabricated a sharpened CeB6 nanoneedle with a tip radius of ~10 nm.
  • Achieved low turn-on electric field (1.6 V nm-1) for 50 nA emission current.
  • Demonstrated exceptional current stability (1.6% fluctuation over 16 hours) at 10-7 Pa vacuum.

Conclusions:

  • CeB6 nanoneedles exhibit excellent field emission properties due to their sharp tips and low work function.
  • The nanoneedle structure enhances stability by reducing gas adsorption/desorption.
  • CeB6 is a promising material for practical point electron sources in microscopy.