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Diffractive Sensor Elements for Registration of Long-Term Instability at Writing of Computer-Generated Holograms
Ruslan V Shimansky1, Dmitrij A Belousov1, Victor P Korolkov1
1Institute of Automation and Electrometry SB RAS, 630090 Novosibirsk, Russia.
Sensors (Basel, Switzerland)
|October 13, 2021
Summary
This study introduces diffractive microstructure sensors for computer-generated holograms (CGH). These sensors detect and quantify CGH fabrication errors using diffraction-based overlay, improving hologram accuracy.
Area of Science:
- Optics and Photonics
- Metrology
- Nanofabrication
Background:
- Computer-generated holograms (CGH) are crucial for optical systems.
- Accurate fabrication of CGHs is essential for their performance.
- Existing methods for detecting CGH fabrication errors can be complex and time-consuming.
Purpose of the Study:
- To develop and validate a novel method for in-situ estimation of CGH fabrication errors.
- To introduce specialized diffractive microstructure sensors for CGH manufacturing.
- To assess the efficiency of these sensors in quantifying writing errors.
Main Methods:
- Integration of two-part diffractive microstructure sensors within CGH patterns.
- Utilizing diffraction-based overlay principles for error detection.
- Employing circular and X-Y laser writing systems for sensor fabrication.
- Mathematical modeling and experimental validation of the sensor performance.
Main Results:
- Demonstrated the ability of diffractive microstructure sensors to detect shifts caused by writing errors.
- Quantified fabrication errors along orthogonal coordinates based on microstructure shifts.
- Validated the effectiveness of the developed method through experimental tests.
- Showcased the efficiency of built-in sensors for CGH writing error estimation.
Conclusions:
- The developed diffractive microstructure sensors provide an efficient and accurate method for estimating CGH fabrication errors.
- This technique enables precise control and improvement of CGH manufacturing processes.
- The built-in sensor approach offers a significant advancement in holographic fabrication quality assurance.

