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Updated: Oct 16, 2025

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
Yilin Miao1, Zhewei Liu1, Xiangning Wu1,2
1School of Computer Science, China University of Geosciences, Wuhan 430078, China.
This study introduces a cost-sensitive siamese network (CSS-Net) to accurately differentiate true and pseudo defects in printed circuit board (PCB) manufacturing. The novel model significantly improves defect detection accuracy while reducing inspection time and costs.
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