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Unified Model of Shot Noise in the Tunneling Current in Sub-10 nm MOSFETs

Jonghwan Lee1

  • 1Department of System Semiconductor Engineering, Sangmyung University, Cheonan 31066, Korea.

Nanomaterials (Basel, Switzerland)
|October 23, 2021
PubMed

Keywords:
Fano factorgate tunneling currentsequential tunnelingshot noisesource-to-drain tunneling current

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