HATCH Score and Left Atrial Size Predict Atrial High-Rate Episodes in Patients With Cardiac Implantable Electronic

Ju-Yi Chen1, Tse-Wei Chen1, Wei-Da Lu1

  • 1Department of Internal Medicine, National Cheng Kung University Hospital, College of Medicine, National Cheng Kung University, Tainan, Taiwan.

Insights

Patients with cardiac implantable electronic devices experiencing atrial high-rate episodes (AHRE) lasting at least 3 minutes face a higher risk of major adverse cardio/cerebrovascular events (MACCE). A HATCH score and left atrial diameter can help predict AHRE occurrence.

Area of Science:

  • Cardiology
  • Biomedical Engineering
  • Clinical Research

Background:

  • Sustained atrial high-rate episodes (AHRE) in patients with cardiac implantable electronic devices (CIEDs) are linked to increased major adverse cardio/cerebrovascular events (MACCE).
  • Predictive models and risk factors for AHRE occurrence remain largely unknown.

Purpose of the Study:

  • To identify independent risk factors for MACCE in patients with CIEDs.
  • To develop and validate risk models for predicting MACCE and AHRE occurrence.

Main Methods:

  • Retrospective analysis of 314 patients with CIEDs.
  • Definition of AHRE: >175 bpm lasting ≥30 seconds.
  • Multivariate Cox and logistic regression with time-dependent covariates to assess MACCE and AHRE risk.

Main Results:

  • AHRE ≥3 minutes occurred in 39.8% of patients; 17.5% experienced AHRE ≥6 hours.
  • AHRE ≥3 minutes was independently associated with MACCE (AUC=0.716).
  • HATCH score (cutoff=3) and left atrial diameter (cutoff=4 cm) independently predicted AHRE ≥3 minutes.

Conclusions:

  • AHRE of ≥3 minutes duration in CIED patients independently predicts increased MACCE risk.
  • Comprehensive assessment including HATCH score and echocardiography is recommended for risk stratification.

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