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Updated: Oct 15, 2025

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
Published on: June 19, 2018
A simple and effective attachment to prevent dome diffraction reaching 2D or 1D detectors in x-ray diffractometers
N M van der Pers1, R W A Hendrikx1, A J Böttger1
1Department of Materials Science and Engineering, Delft University of Technology, Mekelweg 2, 2628CD Delft, The Netherlands.
Abstract:
An attachment has been developed for x-ray diffractometer systems equipped with a domed stage when using a 2D or 1D detector. It consists of a single screen in front of the detector positioned such that it blocks diffraction from the dome. This results in measured data free of disturbing spurious peaks and background, thereby greatly facilitating further data analysis. Its working principle is universally applicable and allows for all specimen orientation movements needed for x-ray diffraction measurements, including texture, stress, and mapping.
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