Deep embeddings and logistic regression for rapid active learning in histopathological images

Yiping Jiao1, Jie Yuan1, Yong Qiang1

  • 1School of Automation, Southeast University, 2nd Sipailou Road, Nanjing, China.

Summary

Deep Embedding-based Logistic Regression (DELR) offers a fast and accurate method for digital pathology image analysis. This approach enables rapid model training and interactive data annotation, achieving high accuracy with significantly reduced computational cost compared to traditional methods.

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