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Inheritance metrics feats in unsupervised learning to classify unlabeled datasets and clusters in fault prediction
Syed Rashid Aziz1, Tamim Ahmed Khan1, Aamer Nadeem2
1Department of Software Engineering, Bahria University, Islamabad, Pakistan.
Peerj. Computer Science
|November 22, 2021
Summary
This study introduces a novel mechanism for labeling software clusters as faulty or fault-free, leveraging inheritance metrics to improve software fault prediction (SFP) on unlabeled datasets.
Area of Science:
- Software Engineering
- Computer Science
Background:
- Software fault prediction (SFP) faces challenges due to the lack of labeled training data.
- Object-oriented inheritance metrics offer insights into software complexity and structure.
Purpose of the Study:
- To evaluate the effectiveness of inheritance metrics in classifying unlabeled software datasets.
- To develop a new mechanism for labeling clusters as faulty or fault-free in SFP.
Main Methods:
- Collected ten public datasets incorporating inheritance and CK (Chidamber and Kemerer) metrics.
- Applied K-means clustering and the Euclidean distance formula.
- Developed an averaging mechanism for cluster labeling.
- Evaluated performance using metrics like True Positive Rate (TPR), Recall, Precision, F1-score, and ROC.
Main Results:
- Inheritance metrics significantly impact SFP, particularly in classifying unlabeled data.
- The proposed average mechanism effectively labels clusters for fault prediction.
- The study demonstrated improved classification accuracy for instances.
Conclusions:
- Inheritance metrics are valuable for improving SFP, especially for unlabeled datasets.
- The developed cluster labeling mechanism is suitable for practical SFP applications.
- Quality assurance practitioners can utilize inheritance metrics for dataset and cluster labeling.
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