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Linear scanning system for THz imaging.

A V Shchepetilnikov, P A Gusikhin, V M Muravev

|November 22, 2021

Summary

A new linear scanning system uses 280 GHz radiation for terahertz sensing. This system achieves 2.3 mm resolution, enabling effective non-destructive testing and security screening applications.

Area of Science:

Physics
Electrical Engineering
Materials Science

Background:

Terahertz (THz) sensing offers unique capabilities for material characterization and imaging.
Developing advanced THz systems is crucial for applications in non-destructive testing (NDT) and security screening.

Purpose of the Study:

To develop and characterize a novel linear scanning system operating at 280 GHz.
To evaluate the system's performance in terms of resolution, dynamic range, and imaging capabilities.

Main Methods:

Utilized a linear array of detectors based on a plasma wave approach for terahertz sensing.
Employed an impact ionization avalanche transit-time-diode signal generator with a frequency multiplier and an optical system.
Performed system characterization including resolution and dynamic range estimation.

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Main Results:

Achieved a system resolution of 2.3 mm.
Determined a dynamic range of approximately 200.
Demonstrated effective imaging capabilities in realistic non-destructive testing and security screening scenarios.

Conclusions:

The developed 280 GHz linear scanning system is a viable tool for advanced imaging.
The system's performance metrics indicate its suitability for practical NDT and security applications.
The plasma wave-based terahertz sensing approach shows promise for future sensor development.