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Lensfree On-chip Tomographic Microscopy Employing Multi-angle Illumination and Pixel Super-resolution
Published on: August 16, 2012
Telephoto-lens-based Optical Differentiation Wavefront Sensor for freeform metrology
Abstract:
We report an Optical Differentiation Wavefront Sensor based on a telephoto lens system and binary pixelated filters. It provides a five-fold reduction in the system length compared to a 4f system with identical effective focal length. Measurements of phase plates with this system are compared to measurements performed with a commercial low-coherence interferometer. The telephoto-lens-based system can measure wavefronts with accuracy better than λ/10 Root Mean Squared (RMS) at λ=633 nm. Experimental investigation shows that the system has a high tolerance to components alignment errors.

