You might also read
Articles linked to this work by shared authors, journal, and citation graph.
Updated: Oct 12, 2025

Author Spotlight: Efficient Image Recognition Using Directional Gradient Histogram Technique and Support Vector Machines
Published on: January 5, 2024
1School of Air Transport, 66323Shanghai University of Engineering Science, Shanghai, China.
This study introduces a support vector machine (SVM) method for accurately measuring surface defect depth using laser ultrasonic inspection. The SVM model achieved high prediction accuracy, outperforming other methods for defect depth identification.
11:34Subsurface Defect Localization by Structured Heating Using Laser Projected Photothermal Thermography
Published on: May 15, 2017
11:47Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments
Published on: February 27, 2013
Area of Science:
Background:
Purpose of the Study:
Main Methods:
Main Results:
Conclusions: