Capacitor With A Dielectric
Dielectric Polarization in a Capacitor
Non-ohmic Devices
Electrostatic Boundary Conditions in Dielectrics
Diode: Reverse bias
Schottky Barrier Diode
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In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased a-VOx
Published on: May 13, 2020
Woo-Jin Jung1, Jun-Young Park1
1School of Electronics Engineering, Chungbuk National University, Chungdae-ro 1, Chungbuk, Cheongju 28644, Korea.
Controlling cell-to-cell interference in 3D NAND flash memory is challenging due to increased word-lines (WLs). This study explores dielectric engineering and proposes a new cell structure to mitigate voltage interference in 3D NAND devices.
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