Search research articles

ABOUT JoVE

Overview Leadership Blog JoVE Help Center

AUTHORS

Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

LIBRARIANS

Testimonials Subscriptions Access Resources Library Advisory Board FAQ

RESEARCH

JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

EDUCATION

JoVE Core JoVE Business JoVE Science Education JoVE Lab Manual Faculty Resource Center Faculty Site

Terms & Conditions of Use

Related Concept Videos

Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

Super-resolution Fluorescence Microscopy

Super-resolution Fluorescence Microscopy

Super-resolution fluorescence microscopy (SRFM) provides a better resolution than conventional fluorescence microscopy by reducing the point spread function (PSF). PSF is the light intensity distribution from a point that causes it to appear blurred. Due to PSF, each fluorescing point appears bigger than its actual size, and it is the PSF interference of nearby fluorophores that causes the blurred image. Various approaches to achieving higher resolution through SRFM have recently been...

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by

Same author

De novo design of DNA origami with a generative diffusion model.

Nature communications·2026

Same author

Classifying Multistate DNA Origami: An Automated Approach with Minimal Labeling and Confidence-Based Filtering.

Journal of chemical information and modeling·2026

Same author

Uncovering Design and Assembly Rules for mRNA-DNA Origami.

Nano letters·2026

Same author

SNUPI: A Computational Framework for Rapid Mechanical Analysis of Structured DNA Assemblies.

JACS Au·2025

Same author

Membrane-targeted DNA frameworks with biodegradability recover cellular function and morphology from frozen cells.

Trends in biotechnology·2025

Same author

A long-staple design approach towards the scalable production of scaffolded DNA origami.

Nanoscale horizons·2025

Search research articles

Related Experiment Video

Updated: Oct 11, 2025

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Published on: December 20, 2016

Accelerating AFM Characterization via Deep-Learning-Based Image Super-Resolution.

Young-Joo Kim¹, Jaekyung Lim², Do-Nyun Kim^1,2,3

¹Institute of Advanced Machines and Design, Seoul National University, 1 Gwanak-ro, Gwanak-gu, Seoul, 08826, South Korea.

Small (Weinheim an Der Bergstrasse, Germany)

|November 27, 2021

Summary

This study introduces a deep learning method to significantly speed up Atomic Force Microscopy (AFM) imaging. This rapid AFM characterization achieves a tenfold reduction in imaging time without sacrificing accuracy for nanoscale materials.

Keywords:

DNA nanotechnology atomic force microscopy deep-learning nanomaterial characterization super-resolution microscopy

More Related Videos

Picometer-Precision Atomic Position Tracking through Electron Microscopy

Picometer-Precision Atomic Position Tracking through Electron Microscopy

Published on: July 3, 2021

Confocal and Super-Resolution Imaging of Polarized Intracellular Trafficking and Secretion of Basement Membrane Proteins During Drosophila Oogenesis

Confocal and Super-Resolution Imaging of Polarized Intracellular Trafficking and Secretion of Basement Membrane Proteins During Drosophila Oogenesis

Published on: May 19, 2022

Related Experiment Videos

Last Updated: Oct 11, 2025

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Published on: December 20, 2016

Picometer-Precision Atomic Position Tracking through Electron Microscopy

Picometer-Precision Atomic Position Tracking through Electron Microscopy

Published on: July 3, 2021

Confocal and Super-Resolution Imaging of Polarized Intracellular Trafficking and Secretion of Basement Membrane Proteins During Drosophila Oogenesis

Confocal and Super-Resolution Imaging of Polarized Intracellular Trafficking and Secretion of Basement Membrane Proteins During Drosophila Oogenesis

Published on: May 19, 2022

Area of Science:

Materials Science
Nanotechnology
Biophysics

Background:

Atomic Force Microscopy (AFM) is crucial for nanoscale material characterization.
Traditional AFM raster scanning limits imaging speed and yield.
High-resolution AFM imaging is often time-consuming.

Purpose of the Study:

To develop a method for rapid AFM characterization.
To enhance AFM imaging speed without compromising accuracy.
To enable efficient nanoscale material analysis.

Main Methods:

A systematic approach combining data acquisition and preparation.
Implementation of deep-learning-based image super-resolution.
Application to structured DNA assemblies for property measurement.

Main Results:

Achieved approximately a tenfold reduction in AFM imaging time.
Demonstrated minimal loss of accuracy in geometrical and mechanical property measurements.
Showcased efficient customization via transfer learning for specific samples.

Conclusions:

The proposed method enables rapid and accurate AFM characterization.
Deep learning significantly improves AFM scanning yield.
This approach is adaptable for diverse nanoscale material analysis.