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Updated: Oct 11, 2025

10:31
Plasma-assisted Molecular Beam Epitaxy of N-polar InAlN-barrier High-electron-mobility Transistors
Published on: November 24, 2016
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Author Correction: A quantitative approach for trap analysis between Al0.25Ga0.75N and GaN in high electron mobility
Walid Amir1, Ju-Won Shin1, Ki-Yong Shin1
1Department of Electrical, Electronic and Computer Engineering, University of Ulsan, Ulsan, 44610, Korea.
Scientific Reports
|December 3, 2021
Abstract
No abstract available in PubMed .
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